Abstract
We develop a scaling approach to flux-line pinning in high-{ital T}{sub {ital c}} superconductors. Our main result is a nonlinear relation {ital V}({ital j}{sub ex}){similar to}exp({minus}{ital Cj}{sub ex}{sup {minus}{mu}}) between the voltage {ital V} and the external current density {ital j}{sub ex}, where the exponent {mu} is related to the roughness exponent and has been estimated in an earlier paper (T. Nattermann, Phys. Rev. Lett. 64, 2454 (1990)). For the low-frequency ac resistivity we find two contributions {rho}{sub 1}({omega}){similar to}{omega}{sup 2}(1{minus}({ital T}/{ital T}{sup *})ln{omega}{tau}{sub 0}){sup 4/{psi}} and {rho}{sub 2}({omega}){similar to}{omega}(1{minus}({ital T}/{ital T}{sup *})ln{omega}{tau}{sub 0}){sup 2/{psi}}, where {psi}{approx}1 in three dimensions, and where {ital T}{sup *} is a characteristic temperature. Similar power laws are obtained for the dynamic susceptibility {chi}{prime}{prime}({omega}), whereas the magnetization due to the change of the applied field varies in time as (ln{ital t}){sup {minus}1/{mu}}.
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