Cold-Rolled Micro-Texture in Polycrystalline 3%Si-Fe

Abstract

Cold-rolled micro-texture of polycrystalline 3%Si-Fe was investigated using high-resolution Electron BackScattering Patterns (EBSP) method. There were deformation bands near grain boundaries. The orientation relationship between the deformation bands and the surrounding deformed grains is explained by the orientation rotation around a <211> axis. The activated slip to generate these deformation bands is estimated from the <211> rotation. The S-value, which is a geometrical index of slip operation against applied stress, of this slip system was not maximum value of all, but it had a common slip plane with an adjacent grain. A hypothesis that the slip system having a common slip plane with an adjacent grain is activated was proposed from the present results.