Abstract
A unique experimental set-up for coincidence measurements is used for the detection of simultaneous emission of two particles, such as an ion and a photon, emitted by this ion immediately after its ejection from the solid. This set-up was also used to measure spatial and energy distributions of secondary excited ions. Quasi-resonant electron exchange between secondary ions and the surface was observed, and a correlation between the surface electronic structure and the yield of secondary ions with a particular energy was discovered. Some of the measured energy spectra of excited secondary ions showed oscillatory behaviour. The obtained results open up the prospect for the use of the coincidence technique to investigate electronic properties of surfaces.The aim of this review is to describe the results of our pioneering use of the coincidence method to study secondary ion, ion-electron and ion-photon emission.
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