Abstract
A detailed knowledge of the micromagnetic structure of thin films is essential for our understanding of the magnetic processes in modern magnetic materials. Many technological applications in the magnetic-recording industry involve thin-film materials including magnetic and magneto-optic recording media and magneto-resistive sensors. Electron microscopy allows imaging of the magnetic structure of such thin films with very high spatial resolution. It is also possible in certain instruments to study the behavior of the materials in the presence of a magnetic field while the specimen is still in the microscope. This facility offers the prospect of full magnetic characterization of thinned materials using electron microscopy.
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