Abstract
We present a detailed study of the angular pattern of the coherent emission from a semiconductor microcavity, under normal incidence excitation. Experimental results obtained by means of interferometric correlation measurements with subpicosecond resolution and by means of frequency and angle resolved cw spectra are compared. We show that a clear distinction between reflectivity and resonant Rayleigh scattering can be very difficult, as interference effects between the two coherent emissions play an important role. The frequency spectra of several RRS speckles have been measured for both the upper and lower polariton branches, denoting a long coherence time and a relevant role played by the microcavity wedge.
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