Abstract
A single-shot phase retrieval algorithm based on a random aperture and partially saturated diffraction pattern is proposed. The diffraction pattern in the saturated area could be retrieved during the iterative process, which circumvents the problem of limited dynamic range of the detector. Besides, the random aperture is easier to be manufactured and if the accuracy of the random aperture is high enough, the design value could be used directly for iterations. It has the potential to be adapted for different wavelengths without additional transmission measurement of the wave modulator. The validity has been demonstrated by simulations and experiment.
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