Abstract
Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., up to 2500 Pa, or higher in some cases. NAP-XPS can probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we present NAP-XPS C 1s and O 1s narrow scans and a survey spectrum of a coffee bean, a material that would be difficult or even impossible to analyze by conventional XPS. Coffee beans are ground to produce coffee powder, which is the source of one of the world’s most common beverages, coffee. The survey spectrum shows small amounts of sulfur and calcium.
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