Abstract
CoFe-coated carbon nanotube (CNT) probes have been successfully fabricated by a radio-frequency sputtering method. The sputtering conditions for obtaining a uniform ferromagnetic film on the CNT probe were investigated. The optimal sputtering conditions were determined from the observations using a scanning electron microscope and an atomic force microscope. CNT magnetic force microscope (MFM) probes prepared under optimized conditions provided us clear images with an ultimate lateral resolution of approximately 10 nm.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
