Coercivity enhancement of FePd thin films prepared by the post-annealing of off-stoichiometric magnetron-sputtered multilayers

Abstract

Attainment of perpendicular coercivity higher than 900 Oe and accurate calculation of the degree of long-range order in an FePd alloy thin film is essential in the realization of the perpendicular magnetic recording media. Here, we prepared the off-stoichiometric FePd films through the multilayer growth of [Fe(2 nm)/Pd(2 nm)] × 30 deposited on MgO(001) substrates by magnetron sputtering. The effects of post-annealing these films at 700 °C for 1 and 10 h on their surface morphologies, and crystallographic and magnetic characteristics were investigated. The results show that, with increasing annealing time, the FePd thin films are predominantly (001)-oriented with a progressive increase of the grain size and surface roughness, as well as the improved crystallinity and reduced micro-strain. Accordingly, the perpendicular coercivity is significantly increased to the value of 1.5 kOe, and Pd loses its 4d electrons upon alloying. Furthermore, analysis of X-ray absorption data elucidates some structural details of the Fe scattering phase in addition to the dominant tetragonal FePd phase. We also present a way of determining the long-range order parameter for the FePd alloy thin film, using the combined information of the tetragonality ratio extracted from extended x-ray absorption fine-structure spectroscopy and the stoichiometric deviation of the thin film.