Abstract
An aberration-corrected JEOL 2200FS scanning-transmission electron microscope (STEM),equipped with a high-angle annular dark-field detector (HAADF), is used to monitor thecoalescence and sintering of Pt nanoparticles with an average diameter of 2.8 nm. This insitu STEM capability is combined with an analysis methodology that together allows directmeasurements of mass transport phenomena that are important in understanding howparticle size influences coalescence and sintering at the nanoscale. To demonstrate thefeasibility of this methodology, the surface diffusivity is determined from measurementsobtained from STEM images acquired during the initial stages of sintering. The measuredsurface diffusivities are in reasonable agreement with measurements made on the surface ofnanoparticles, using other techniques. In addition, the grain boundary mobilityis determined from measurements made during the latter stages of sintering.
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