Abstract
Co/sub 77/Cr/sub 20/Ta/sub 3/ films were deposited on a Pt seed layer, and their crystallographic and magnetic characteristics were investigated. The Co-Cr-Ta/Pt bilayered films deposited at the substrate temperature of 250/spl deg/C revealed excellent c-axis orientation and exhibited high perpendicular coercivity. For the Co-Cr-Ta/Pt/Ti trilayered films, Ti underlayer promoted fine granulation in the Pt layer and improved magnetic characteristics of the ultra-thin Co-Cr-Ta recording layer. Media noise level of the Co-Cr-Ta/Pt disk was small at high recording density range. The Co-Cr-Ta/Pt bilayered films are useful for fabrication of perpendicular magnetic recording media.
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