Abstract
A CMOS (complementary metal-oxide semiconductor) flatpanel X-ray detector is a two-dimensional silicon image sensor with a scintillator. We have tested the performance of two types of CMOS detectors in simultaneous small-angle/wide-angle X-ray scattering experiments. Both are active-pixel devices that have an amplifier in each pixel. Wide-angle patterns were recorded with the detector just behind the specimen and very close to the beam. The quality of the images shows that these detectors are suitable for this purpose.
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