Abstract
This letter investigates the capability of dielectric charge control loops to cope with charge induced by ionizing radiation. To this effect, an microelectromechanical systems (MEMS) variable capacitor has been irradiated with X-rays and gamma-radiation in three scenarios: 1) without polarization; 2) using an open-loop dielectric charge mitigation strategy; and 3) using a closed-loop control method. The results show that the charge effects induced by radiation can be partially compensated using dielectric charge control. [2015-0103]
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