Closed-form solutions for voltage pulse response of open, shorted, and loaded distributed RC thin film structure

Abstract

A closed-form solution is presented for a uniformly distributed open, shorted, and loaded RC thin film structure, for voltage pulse response, using bisection technique. Laplace transformation, Heaviside theorem, and contour integration algorithms. The voltage and current transient responses are plotted for different normalized load, time, and pulsed-width parameters. Verification of the loaded solution has been made and lies between the open and shorted responses. The solutions are expressed in terms of theta functions. >