Abstract
We investigate a C-RAN model based on single nearest RRH association with Nakagami- m fading and path-loss fading. In the analysis the parameter $mL$ is not restricted to be an integer, where L is the number of antennas per RRH. We derive several closed-form expressions for the ergodic capacity, not restricted to the high SNR regime, for two classes of power path loss exponents. Moreover, the closed-form expression of a tight lower bound is provided for general scenarios. Finally, the results of simulation and numerical integration are provided to show the cross-verification.
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