Close-to-Functional Broadside Tests With a Safety Margin

Abstract

Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric.