Abstract
Polycrystalline Cd1-xZnxTe thick films (x ∼0.05) with thicknesses above 400 µm were prepared by the close-spaced sublimation (CSS) as a conversion layer for next-generation highly efficient flat-panel X-ray detectors. The effects of the substrate temperature on the properties of the Cd1-xZnxTe layer were investigated, and it was found that the surface morphology and preferred crystallographic orientation depended on the substrate temperature. Furthermore, the control of the initial stage of deposition of Cd1-xZnxTe films was attempted, and high-quality Cd1-xZnxTe thick films were obtained by deposition after removing the surface layer of the sintered CdTe and ZnTe powder source.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
