Abstract
ZnSe films have been deposited by a simple technique, close-spaced evaporation. The layers were grown on glass substrates maintained at different temperatures that vary in the range of 200–400 °C. The physical characteristics of the films such as chemical stoichiometry, structural properties and energy band gap of the films were investigated using energy-dispersive X-ray analysis, X-ray diffractometry and optical spectrophotometry, respectively. The influence of substrate temperature on the different parameters was studied and discussed.
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