Abstract
More and more surface probes have been used instead of bobbin coils to detect smaller flaws in eddy current testing. Needs of high accuracy testing have been making eddy current testing use precise scanning of the probes. Flaw imaging has been used in eddy current testing in order to identify small flaws [1–8]. However, the eddy current testing using the conventional pancake coil probe provides only blurred images of flaws. In order to obtain clear flaw images in eddy current testing, the authors first tried to restore clear flaw images from the blurred eddy current testing images using deconvolution method. However, the deconvolution method provided only clear but rather noisy images.
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