Abstract
Fabrication of large-area clean graphene sheets is the first step toward the development of high-performance applications in surface chemistry and biotechnology as well as in high-mobility electronics. Here we demonstrate the clean transfer of graphene grown by chemical vapor deposition on Cu foil, with surface cleanness defined by transmission electron microscopy (TEM) in combination with Raman scattering on the same position of suspended graphene sheets. For clean graphene, the Raman spectra exhibit distinctive features that can explicitly discriminate from that of graphene covered with a thin layer of amorphous carbon such as residual poly(methyl methacrylate) (PMMA). By applying this technique to graphene sheets with various degrees of surface cleanness, we show that the quantitative characterization of the thickness of surface contaminants is possible based on multiple reflections and interference of light in samples.
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