Classification of holographic fringe patterns inherent in through hole drilling in residual stress field

Abstract

Comparative analysis of actual fringe patterns, which are induced by combined implementing the hole drilling method and reflection hologram interferometry for residual stresses determination, is presented. Involved considerations are related to plane thin-walled structural elements. A set of interferograms of perfect (ideal) form is selected proceeding from one-side measurements. A base for recognising each specific ideal configuration is a fine coincidence between actual interferograms and analogous reference fringe patterns constructed for the same stress state. Perfect (ideal) both actual and reference fringe patterns are defined as a response of pure membrane 2D stress field on through hole drilling between exposures. Main principles of creating the regular catalogue of reference fringe patterns inherent in through hole drilling in thin-walled components are formulated. Emphasis is made on a careful collecting and classifying actual interferograms with clear indications of bending stress presence in total residual stress field. Evidences needed for a reliable classification of the type of residual stresses field of interest are established and verified. A response of superimposed residual stress field, which consists of both membrane and bending components, is characterised by various deviations of each specific fringe pattern from an ideal form. More deep analysis of fringe patterns related to superimposed residual stress field is based on specially designed technique. The main essence of the approach developed is simultaneous measurements of through hole distortions in two principal strain directions on opposite sides of thin plane specimen. These sides are faces of the drill entrance and exit. Sophisticated optical set-up that is capable of obtaining high-quality fringe patterns in the course of two-side measurements is developed and implemented. Typical set of fringe patterns obtained for single probe hole on opposite specimen faces is presented.