Abstract
Background: As known that the semi-supervised algorithm is a classical algorithm in semi-supervised learning algorithm. Methods: In the paper, it proposed improved cooperative semi-supervised learning algorithm, and the algorithm process is presented in detailed, and it is adopted to predict unlabeled electronic components image. Results: In the experiments of classification and recognition of electronic components, it show that through the method the accuracy the proposed algorithm in electron device image recognition can be significantly improved, the improved algorithm can be used in the actual recognition process . Conclusion: With the continuous development of science and technology, machine vision and deep learning will play a more important role in people's life in the future. The subject research based on the identification of the number of components is bound to develop towards the direction of high precision and multi-dimension, which will greatly improve the production efficiency of electronic components industry.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have