Abstract
2014 A general formulation of the avalanche statistics in an ideal diode is presented, in an effort to extend the theory to the nonlinear regime. All known results, including the time dependency, are recovered with this procedure. It unifies the various treatments in a consistent way and enables an analysis of nonlinear phenomena. Where the injection transient and different drift velocities become important, the invariant imbedding technique is used. The limitations of the continuity equations as a starting point for a statistical treatment are discussed. An example is given where the classical methods (Langevin, G.-R. theorem, a-c perturbations, Fourier analysis) fail in the nonlinear case. Revue Phys. Appl. 15 (1980) 1585-1597 NOVEMBRE 1980, 1
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