Abstract
We investigate the performance of an Er:fiber laser based femtosecond frequency comb for precision metrological applications. Instead of an active stabilization of the comb, the fluctuations of the carrier-envelope offset phase, the repetition phase, and the phase of the beat from a comb line with an optical reference are synchronously detected. We show that these fluctuations can be effectively eliminated by exploiting their known correlation. In our experimental scheme, we utilize two identically constructed frequency combs for the measurement of the fluctuations, rejecting the influence of a shared optical reference. From measuring a white frequency noise level, we demonstrate that a fractional frequency instability better than 1.4 x 10(-14) for 1 s averaging time can be achieved in frequency metrology applications using the Er:fiber based frequency comb.
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