Abstract
A simple technique for measuring the velocity versus force curve of a circular magnetic domain has been devised. The technique consists of moving a domain under a straight current conductor which is adjacent to the surface of the wafer. A square-wave current is applied and the amplitude adjusted until the domain jiggles back and forth under the conductor a distance equal to R , where R is the radius of the domain. The blurred domain is observed using the Faraday effect. The magnitude of the effective driving field for a conductor with a width equal to R , spaced 0.1 h above the wafer, is 0.158 I/h when R = h ( h is the wafer thickness). The velocity is equal to 2 Rf .
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