Abstract
This article continues the series of publications that describe in detail the process of development, research, and implementation of circuit modeling and machine vision mechanisms in industrial equipment for laser trimming of resistors in order to obtain products with better characteristics and increase the economic efficiency of the process. A circuit model of the process of laser trimming of film-resistive elements under the action of a measuring voltage source, as well as an algorithm for correcting this model during laser trimming, has been developed. The paper considers the principles of building a circuit model of film resistor cutting. The conductive resistive medium is defined with the component equations and the topology of the circuit model. A method of estimating the electric parameters of a resistor operating in the system with a measuring voltage source is shown. An equation system for the node voltages is defined, and the resistive layer parameters are analyzed as the circuit model structure changes during the cutting process.
Highlights
Laser trimming of film and foil resistive elements (RE) is currently the most popular means for obtaining the required resistance value both for a single chip-resistor or microwave attenuator and for an integrated one into a hybrid integral circuit [1–3]
A natural and easy way for defining information on the way of connecting and on reference positive directions for currents and voltages for the branches of a circuit model is an oriented graph, which would correspond to a given circuit and is built following the rule: each element of the circuit with two terminals shall be replaced by a linear segment called a branch, with an arrow pointing at the positive direction for the current via this branch
Together with the results of the previous article [38], the authors have suggested circuit models for the process of laser trimming of film resistor elements functioning in a system both as a direct current source and direct voltage source
Summary
Laser trimming of film and foil resistive elements (RE) is currently the most popular means for obtaining the required resistance value both for a single chip-resistor or microwave attenuator and for an integrated one into a hybrid integral circuit [1–3]. Ramirez-Angulo, et al made a significant contribution to the study of the laser trimming process and the construction of simulation systems In their works [26–28], based on the solution of the Laplace equation by the finite element method, the authors demonstrated the developed program FIRE (FIlm REsistors). In connection with the above, the purpose of this work, being the follow-up of the previously submitted article [38], is to develop a circuit model for the process of film REs laser trimming using a measuring voltage source, as well as an algorithm for correcting this model during laser trimming To achieve this goal, it is necessary to perform the following tasks: to create a basic representation of the circuit model of the conductive medium of the RE, to formulate a mathematical description of the model of the conductive resistive medium, and to develop an algorithm for calculating the parameters of the resistor when changing the circuit model in the process of laser trimming.
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