Choquet Integral-Based Fusion of Multiple Patterns for Improving EIT Spatial Resolution

Abstract

Electrical impedance tomography (EIT) is a promising visualization technology with advantages of low cost, nonradiation, and rapid response. The most used EIT pattern leads to relatively limited measurements by which the EIT spatial resolution is low. However, multiple EIT patterns can generate more measurements, thus fusing multiple EIT patterns is helpful to improve the EIT spatial resolution. But the most challenging task of fusing multiple EIT patterns is how to correctly reflect the interaction among them. In this paper, eight typical EIT patterns are employed to obtain more measurements, and Choquet integral method is used to represent the interaction among EIT patterns. Consequently, the optimal combination of measurements from eight EIT patterns is selected to reconstruct the EIT image. Simulations and experiments were carried out and the results indicated that the proposed method can effectively improve the spatial resolution of reconstruction images.