Abstract
A radiotracer technique was used to study the adsorption of xenon in the presence of fluorine on nickel and palladium foils. Isotherms measured at temperatures of 243–373 °K showed that xenon was adsorbed. Examination of the surfaces by electron microscopy showed that the presence of xenon markedly influences the attack of fluorine on the metal. It is suggested that xenon is chemically bound to fluorine in the absorbed state, and that this constitutes the intermediate in the catalyic formation of xenon difluoride.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
