Abstract
Abstract The atomic coordinates of the TbTi 0.85 Mo 0.15 Ge, GdTiGe and TbTiGe compounds have been refined from single crystal X-ray diffraction measurements. Both former compounds have a tetragonal CeScSi-type structure ( I4/mmm , ordered variant of the La 2 Sb-type) while TbTiGe crystallizes in the CeFeSi-type ( P4/nmm ). The structural properties and the relative stability of both CeFeSi and CeScSi-type structures along the whole RTiGe series (R=La–Nd, Sm, Gd–Tm, Lu) are discussed and compared to those of others isotypic RTX compounds.
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