Abstract
The chemical shifts of x-ray spectra are now frequently observed with EPMA (Electron Probe Microanalysis). The conventional method of chemical-shift analysis with EPMA is to compare the peak shapes and peak positions of standard spectra with those of unknown spectra. We reported that O-Kα peak shapes detected by using a TAP (Thallium acid phthalate) crystal reflect their crystal structures. Fig. 1 shows these O-Kα spectral peaks. In the present study, concerning the BiSrCaCuO superconductor made by the sintering method, it was observed that the O-Kα spectra of several kinds of phases reflected their crystal structures. Moreover, it is now possible to observe these chemical shifts of spectra by using the color mapping method in EPMA.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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