Abstract
This work reports the growth and characterization of nanocrystalline Zinc magnesium sulphide thin films fabricated on glass substrates using the chemical bath deposition technique. X-ray diffraction studies revealed that the as-prepared films are nanocrystalline in nature and possess a cubic phase with a preferred orientation along the (111) plane. The crystallite size increases from 18.3 to 29 nm with deposition time. The field emission scanning electron microscope micrographs showed uniform nanostructures on the film surface. The grain sizes increased from 215 to 310 nm with deposition time. EDX spectra displayed the presence of elements Zn, Mg, and S. The absorbance peak increased with deposition time and all the films had a transmittance of over 80 %. From the absorption measurements, the band gap showed an increase from 3.848 eV to 3.945 eV with deposition time. The fabricated ZnMgS thin films exhibit crucial characteristics suitable for optoelectronic devices.
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