Abstract
This study focuses on the synthesis and comprehensive characterization of sulphur nanoparticles (S-NPs) using a precipitation method. The synthesis involved sodium thiosulphate and cetyl trimethyl ammonium bromide surfactants in a concentrated hydrochloric acid medium. The resulting S-NPs were thoroughly characterized using various advanced techniques. X-ray diffraction (XRD) analysis confirmed the crystalline nature of the nanoparticles, revealing distinctive diffraction patterns. Transmission electron microscopy (TEM) provided high-resolution images that elucidated the size and morphological aspects of the S-NPs, which exhibited a uniform size distribution. Scanning electron microscopy (SEM) further supported the morphological information, showcasing the surface features of the nanoparticles. Additionally, Fourier-transform infrared spectroscopy (FT-IR) analysis enabled the identification of functional groups and surface chemistry changes associated with the S-NPs. The comprehensive utilization of XRD, TEM, SEM, and FT-IR analysis provides a detailed understanding of the structural, morphological, and chemical attributes of the synthesized sulphur nanoparticles, paving the way for their potential applications in various fields.
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