Abstract
AbstractThe chemical speciation of sulfur in activated carbon has been performed by analyzing Kα1 x‐ray spectra of sulfur recorded with a home‐made wavelength‐dispersive, particle‐induced x‐ray emission spectrometry system (WD‐PIXE). MoS2, S, Na2SO3, and (NH4)2SO4 were used as reference materials to determine the chemical shift of sulfur Kα1 x‐ray energy. The energy resolution defined by the full width at the half maximum was 0.6 eV or 0.03% for sulfur Kα1 x‐ray. This was sufficiently high for speciation of sulfur in solid materials. The chemical shift of sulfur in activated carbon clearly showed that sulfur resides as elemental sulfur. This new speciation technique for solid materials successfully demonstrated that sulfate ions in aqueous solution was reduced to form elemental sulfur on an activated carbon under low applied voltage of < 5 V and current of < 1 mA. Copyright © 2009 John Wiley & Sons, Ltd.
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