Chemical effect on Lγ4 and Lγ5 X-ray lines in Thallium complexes

Abstract

The previous outcomes of Wavelength Dispersive X-ray Fluorescence (WDXRF) technique were strictly restricted to the compositions of varieties of the materials where non-destructive and non-intrusive features can be persecuted. At present, the advancement in WDXRF spectrometer has made a huge impact on the chemical profiles in distinct chemical materials. The present work offers useful insights regarding the chemical effect in various Tl complexes viz., Tl pure, Tl(NO3)3, Tl2O3, TlI, TlCl and Tl2SO4 on the Lγ4 and Lγ5 X-ray lines. To our best knowledge, the data associated with the Lγ4 and Lγ5 X-ray lines of Tl complexes were not reported in the literature. The obtained findings indicate that the Lγ4 X-ray line emitted from different Tl complexes exhibit energy shift ~ (4–7.21) eV while the Lγ5 X-ray line shows ~ (1.4–4.4) eV with respect to that emitted from the pure Tl. In general, the Tl+3 complexes show large energy shifts and relative intensity ratios as compared to the Tl+1 complexes for both X-ray lines. The sharply diverging profile changes observed in different Tl complexes can be understood in terms of the mixed-valence states, relative intensity ratio, effective charge, core-valence exchange interactions, crystal effect and distinct ligands. Additionally, the possible correlation between energy shifts and factors affecting these are also examined in the present work.