Abstract
The fundamentals of chemical derivatization techniques as applied to the quantitative analysis of ultrathin surface layers of various organic compounds via functional groups were considered. Using X-ray photoelectron spectroscopy as an example of the most informative and almost nondestructive technique for characterization of thin layers, the general requirements imposed on the selective chemical reactions and possible artifacts were discussed. The validity of the technique was illustrated by the examples of analyses of surface layers of organic polymers with known concentrations of surface functional groups, plasma-modified polymers, and carbon fibers. It was noted that selective chemical reactions are successfully used in other techniques for studying material surfaces. The surface analysis of organic materials via functional groups can be performed with a simultaneous increase in the sensitivity of the corresponding spectral technique.
Published Version
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