Abstract
The paper presents a general review of the effects induced by high fluence ion implantation in silicate and fluoride glasses. Charged particle irradiation introduces network damage and alters the chemical composition. Compositional changes are related to radiation enhanced diffusion processes, preferential sputtering and internal electric field formation. These effects determine modifications in the mechanical, optical and chemical properties of the glasses.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
