Abstract
Analysis of a dust sample (e.g. collected during a cometary rendezvous mission) by SIMS (Secondary Ion Mass Spectroscopy) can provide information on elemental abundances (⩽ 100 amu), the molecular composition of grain surfaces, and isotopic ratios of selected elements. This can be accomplished with dust covering as little as 10 −4 of the collector surface area. In order to demonstrate these capabilities a special experimental set-up for substrate preparation, dust collection and SIMS analysis of dust under ultrahigh vacuum conditions was developed. The comparison of elemental abundance ratios for different olivines and pyroxenes measured with the special SIMS equipment with that measured by an electron microprobe indicated an accuracy for SIMS of the elemental abundance measurements of ⩽ 30%. By varying the energy threshold of secondary ions to be mass-analysed from 0 to 50 eV it is possible to identify molecular ions in the spectra and to estimate their abundance with respect to elemental ions on the same mass line. The ratios of molecular to elemental ions vary by a factor of 1–25. The concept for a future cometary rendezvous experiment as well as first results of chemical investigation on mineral dust samples obtained are reported.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
