Abstract
SUMMARYChemical analysis was carried out before and after the constant voltage hold test that was an acceleration deterioration examination to clarify deterioration factors of electric double‐layer capacitor (EDLC). The results showed that the stress test slightly caused the increase of internal resistance. It was also confirmed that the range of fluorochemicals was formed on the electrode surface for approximately 10 nm in depth using electron spectroscopy for chemical analysis (ESCA). From the chemical analysis of the electrolyte using an inductively coupling plasma emission analyzer (ICP‐OES), it was confirmed that the electrolyte included silicon which is one of the ingredient elements of an electrode and that the increase in holding voltage in the stress test decreased the silicon density in the electrolyte.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
