Abstract
Depending on the application, electronic systems and devices can be subjected to different radiation environments. According to the type of radiation encountered during operation, electronic components are simultaneously vulnerable to cumulative and single event effects. In addition, inelastic interactions of highly energetic particles with high-Z materials generate highly ionizing products. This can lead to catastrophic failures and therefore can have a significant impact on the reliability of electronic devices. For this reason, it is necessary to test electronic devices/systems in representative environments. For this purpose, a mixed field radiation test facility called CHARM has been established at CERN. Its radiation environment is not only representative of particle accelerators, but also of atmospheric, ground level and space applications.
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