Abstract
The Gas Electron Multiplier (GEM) detector is one of the advanced members of the Micro Pattern Gas Detector (MPGD) family, used in High Energy Physics (HEP) experiments as a tracking device due to its high rate handling capability and good spatial resolution. The uniformity in the performance of the detector is an essential criterion for any tracking device.The presence of the dielectric medium (Kapton) inside the active volume of the GEM chamber changes its behaviour when exposed to external irradiation. This phenomenon is known as the charging-up effect. In this article, the charging-up effect over the entire surface of a Single Mask (SM) triple GEM chamber of dimension 10 cm × 10 cm is reported. The study of uniformity in terms of gain, energy resolution and count rate for the same chamber is also presented before and after the charging-up of the GEM foils.
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