Abstract
In this work, we effectuated the numerical simulations of the phase dynamics of an array of Josephson junctions taking into account the capacitive coupling between the neighboring junctions and the diffusion current in the stack. We observed that, if we increase the coupling and the dissipation parameters, the IV characteristic changes qualitatively from the IV characteristics studied before. For currents greater than the critical one, we obtained an additional branch in the IV characteristics. This branch is characterized by a lower voltage than the outermost one. Moreover, we obtained an additional charging of the superconducting layers in the IV region for currents greater than the critical one. We studied the time evolution of this charging by the means of Fast Fourier Transform. We proved that the charge density wave associated with this charging has a complex spectral structure. In addition, we analyzed the behavior of the system for different boundary conditions, appropriate to different experimental setups.
Highlights
Arrays of Josephson junctions (JJs) formed by alternating superconducting and insulating layers are known as perspective elements for superconducting electronics [2,3,4]
M Lyatty et al observed an additional branch on the IV characteristic of the YBCO nanowires (YBCO is characterized by the lowest distance and the strong coupling between the superconducting lyers) and the study was implemented for higher temperatures, which is in correspondence with high values of the dissipation parameter and is in agreement with our hypothesis about the necessity of strong coupling and high values of the dissipation parameter
We have found the traveling wave branch, which is characterized by the voltage lower than the outermost one
Summary
Arrays of Josephson junctions (JJs) formed by alternating superconducting and insulating layers are known as perspective elements for superconducting electronics [2,3,4]. Previous research proved generation of THz radiation and charge density waves in this region, which can play an important role in some technological applications. We propose another way to realize branching in the IV-characteristic of the JJs array, which will be described below. Dynamics of charge oscillations are an important marker for the identification of different branches in the IV-characteristic and have significant influence on the stacks behavior. Appears in the IV-characteristic due to the charge oscillations and a significant voltage step occurs in the breakpoint region [30]. A. Gaafar studied the resonance related hysteresis in a stack of Josephson junctions for small dissipation parameter values (from 0.05 to 0.3). We extended the study of the behavior of Josephson junctions arrays presented in Reference [27] for high values of dissipation parameters.
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