Abstract
We investigate the charge transport mechanism in copper phthalocyanine thin films with and without traps. We find that the density of interface states at the grain boundaries can decide the mechanism of charge transport in organic thin films.
Highlights
The performance of organic devices based on amorphous[1,2] and polycrystalline[3,4] thin lms depends on the efficiency of charge transport within thin lms
We show that multiple trapping and release (MTR) model can explain the charge transport in the polycrystalline organic thin lms having intrinsic traps at the grain boundary interfaces
The presence of traps is analyzed by trap charge limited conduction (TCLC) in two terminal devices
Summary
The performance of organic devices based on amorphous[1,2] and polycrystalline[3,4] thin lms depends on the efficiency of charge transport within thin lms. We show that MTR model can explain the charge transport in the polycrystalline organic thin lms having intrinsic traps at the grain boundary interfaces.
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