Abstract
Charge transport properties of polyimide films implanted with 80 keV Co ions at two different fluences (series I: 1.25 × 1017 ions/cm2, series II: 1.75 × 1017 ions/cm2) are studied in detail. For series I, the temperature dependence of surface resistivity fits Mott's equation very well. It is on the insulating side of the insulator-metal transition (IMT). However, for series II, the temperature dependence of surface resistivity is not in agreement with Mott's equation. It is on the metallic side of IMT. The magnetotransport properties of these two series are also studied. No significant magnetoresistive effect is observed for series I at both 5 K and 300 K. For series II, an obvious magnetoresistive effect is observed at 5 K, while there is no magnetoresistive effect at 300 K. Rutherford backscattering spectrometry (RBS) is applied to confirm the actual fluence for these two series.
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