Abstract
We report the structural and electronic characterization of the charge order phase inBi0.4Ca0.6MnO3 films, in which photoinduced resistivity changes have been observed at temperaturesapproaching room temperature. Lattice distortions associated with the charge order areobserved in all films, and both the wavevectors and displacements of the distortions are inthe plane of the film. Films under compressive and tensile strain are observed to havedifferent resonant x-ray scattering characteristics—a result that may shed light onthe mechanism responsible for the photosensitivity exhibited by this material.
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