Charge Injection Device (CID) technology — A solution for photon and particle imaging applications

Abstract

Charge Injection Device (CID) imagers provide key electro-optical performance features and versatile readout capabilities for spatial and radiometric measurements of photon and particle radiation. CIDs have many of the performance features required for machine vision and scientific applications including good resolution, broad spectral response, resistance to blooming and asynchronous operation for feature detection and measurement. Single pixel imaging devices and two-dimensional arrays possess exceptionally large pixel charge capacities and wide dynamic range that provide quantum (shot-noise) limited operation. Commercial devices have demonstrated the robustness and capability to operate in hostile (including ionizing radiation) environments. Recently-developed CID imagers and camera systems have incorporated new on-chip architectures and process technology that provide low-noise performance and permit exploitation of additional features including random-pixel addressability, true non-destructive pixel readout (NDRO), and two-dimensional windowing (subarray readout). These CID features allow scientists to monitor and adapt application exposure in real time, reduce noise, and read out small pixel subarrays at fast rates. CID imagers possess structural characteristics and improved radiation tolerance (∼ 10 6 gamma) which allow these devices to operate in harsh radioactive environments and image different forms of radiation including X-rays, electron beams and nuclear radiation.