Abstract
The laser-induced pressure pulse (LIPP) method was used to measure charge distributions in electron-beam charged Teflon, Mylar, and Kapton as a function of charge density. One-side metallized 24 to 25 mu m thick Mylar and Kapton films were charged through their nonmetallized face with 10 to 40 keV electron beams and investigated with the LIPP method. The measurements show negative space-charge layers whose depth increased with electron-beam energy and with injected charge density. In addition, positive surface- and near-surface-charge layers due to air breakdown and negative surface-charge layers caused by ohmic relaxation or by dipole effects are present on some samples. >
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