Abstract
We present the observation of charge density waves and strain waves in thin epitaxial Cr(001) films by means of scattering with synchrotron radiation. The Cr films were grown by molecular beam epitaxial techniques on MgO(001) substrates and on Al2O3 (11¯02) substrates with a Nb(001) buffer layer. The ratio between the amplitudes of both modulations can be derived from the measured intensities. From the data a substrate induced change of this ratio and of the modulation wavelength as compared to the bulk value can be infered.
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