Abstract
2H- and -phase monolayer MoTe2 films on highly oriented pyrolytic graphite are studied using scanning tunneling microscopy and spectroscopy (STM/STS). The phase transition of MoTe2 can be controlled by a post-growth annealing process, and the intermediate state during the phase transition is directly observed by STM. For 2H-MoTe2, inversion domain boundaries are presented as bright lines at high sample bias, but as dark lines at lower sample bias. The dI/dV mappings reveal the distinct distributions of electronic states between domain boundaries and interiors of domains. It should be noted that a 2 × 2 periodic structure is clearly discernable inside the domains, where the STS measurement shows a small dip of size ∼150 meV at the vicinity of the Fermi level, indicating that the 2 × 2 periodic structure may be an incommensurate charge density wave. Moreover, a 4 × 4 periodic structure appears in 2H-MoTe2 grown at a higher substrate temperature.
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