Charge carrier generation, transport and trapping in amorphous poly (N-vinylcarbazole) films

Abstract

Studies on hole photoinjection in films of poly (N-vinylcarbazole) under space-charge-free conditions by the time-of-flight technique have revealed the presence of deep hole traps. The trap density is estimated to be 5–10 × 10 18 m −3. The voltage and thickness dependence of the initial current in the space-charge-free photocurrent transient is explained in terms of the field dependence of the carrier generation and transport processes.