Charge behavior analysis in thin solid film by using simultaneous TSDC and LIPP measurements

Abstract

This chapter explains the charge behavior analysis in thin solid film by using simultaneous Thermal Stimulated Discharge Currents (TSDC) and Laser-Induced-Pressure Pulse (LIPP) measurements. TSDC analysis is a very effective technique to understand the charge stability and space charge behavior in a charged thin film but the real position of those charges cannot be identified. For that, a novel charge analyzing system is developed. During TSDC measurements, a LIPP method is applied to observe the charge in-depth profile of the corona charged film in the new system. The chapter explains this system and the new results obtained by it. LIPP observation need only ten seconds or so and can be done during TSDC analysis. Therefore, at some temperature during TSDC analysis, a weak DC current measurement is stopped for about ten seconds and connected to LIPP measurement. The position of charges that cause some TSDC peaks is identified and charge behavior in the Polytetrafluoroethylene (PTFE) film is visibly observed.